Now showing items 1-2 of 2

    • RATHNAYAKA, KDD; HENNINGS, BD; Naugle, Donald G. (American Physical Society, 1993)
      The resistivity of codeposited amorphous Ti1-xAlx films has been measured from 1.5 to 300 K over the composition range 0.4 less-than-or-equal-to x less-than-or-equal-to 0.92, and the Hall coefficient has been measured at ...
    • WANG, PS; WILLIAMS, JC; RATHNAYAKA, KDD; HENNINGS, BD; Naugle, Donald G.; KAISER, AB. (American Physical Society, 1993)
      Measurements of the Hall coefficient and resistivity for highly oriented Tl2Ba2CaCu2O8+delta thin films are reported. The temperature dependence of cotTHETA(H), where THETA(H) is the normal-state Hall angle, for a single-phase ...